Section
Physical Sciences
Abstract
An algol computer program is described, by means of which the spectral reflectivity for any angle of incidence may be calculated for a surface consisting of up to two thin absorbing films on a bulk substrate. The values of optical constant, n and k, for the materials used and also the thickness of the films, are the only data required. Calculated reflectivities have been shown to be consistent with experimental results.
Recommended Citation
O’shea, K.R.
(1975)
"Theoretical Evaluation of Selective Radiation–Absorbing Surface,"
Tanzania Journal of Science: Vol. 1:
Iss.
2, Article 6.
Available at:https://doi.org/10.65085/2507-7961.2125